In
SAP Solution Manager we have various reports on
Test Suite Analytics reports. Technical developers may get requirements on various reports on Test Plan/Test Package/Test Case levels. We will see the available CDS Views provided by SAP standards.
Test Suite - Analytics provides 3 types of reports:
- Completeness and Gap Report - Used during Test suite objects creation phase
- Test Execution Analytics - Used during Testing execution in progress/complete
- Status and Progress Analytics - BW based reports
We will focus on
Test Execution Analytics in this blog post. All technical objects are available in package AGS_SMT_UI_REPT.
Report |
Base CDS View (Database View) |
Description |
Multiple Test Plan Status |
AI_CTPLN_EXECUTION_V2_RPT (AICTPLNEXECRPT2) |
Test Plan level information available in this CDS like Test Plan Id, Test Plan key, smud key, and more number of counts are starting with nb_ .
Since the Test Plan description is language-dependent, separate logic needs to be written when you are creating reports. The same applies to other description fields. |
Multiple Test Plan Status Details |
AI_CTPLN_ANALYTC_1_TPLN_V2_RPT(AIC1TPLNRPTV2) |
Provides list of Test Status entries created from Test Case for Test Plan input. Also details about each Test Status are provided. |
Test Plan – Test Package Analysis |
AI_CTPCK_ANALYSIS_PART1_V2_RPT(AICTPLNANALP1V2)
AI_CTPCK_ANALYSIS_PART2_V2_RPT(AICTPCKANALP2V2) |
Single Test Plan input. More specific counts about Test Pack level details. |
Test Package - Test Cases Analysis |
AI_CTPLN_ANALYTC_1_TPLN_V2_RPT(AIC1TPLNRPTV2)
AI_CTPLN_TCSE_TSTR_DEFECT(AICTCSETSTRDFCT) |
Single Test Plan and Test Package as input and Test Case level output in detail with counts and status. |
Test Plan - Test Cases Analysis |
AI_CTPLN_ANALYTC_1_TPLN_V2_RPT(AIC1TPLNRPTV2)
AI_CTPLN_TCSE_TSTR_DEFECT(AICTCSETSTRDFCT) |
Single Test Plan input and Test Case details in output. |
Test Plan - Defects Analysis |
AI_CTPLN_DEFECT_ANALSIS_V2_RPT(AICTPLNDFCTRPT2) |
Defect List for Test Plan input |
Test Package - Defects Analysis |
AI_CTPLN_DEFECT_ANALSIS_V2_RPT(AICTPLNDFCTRPT2) |
Defect List for Test Package input |
All these CDS views are built to use across multiple database systems, so no complex logic is involved instead more layered approach is followed to build results.
Any technical developer can navigate parent views from any of these CDS views if available and can be reused for our own custom reports.
If you have SAP HANA DBServices, you can build new CDS based on this and create new applications. Existing applications are mostly based on Floorplan Manage components and new-gen people can try with advanced UIs(SAP Fiori).
Happy Coding !
