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Author's profile photo Jeff Wootton

ESP for Predictive Maintenance to improve manufacturing yields

Some of my SAP colleagues presented an interesting paper on an event processing use case at the DEBS 2013 conference this year (the 7th ACM international conference on Distributed event-based systems).  The paper, entitled “HUGO: real-time analysis of component interactions in high-tech manufacturing equipment presents the findings of a research project they carried out to monitor and analyze – in real-time – sensor data from high-tech manufacturing equipment with the goal of increasing system yield by looking for correlations among the different sensor readings that could be used to predict quality deterioration.

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